Abstract
Ionization loss spectroscopy has been performed on diamond deposited by chemical vapor deposition and on graphite by use of conventional Auger equipment (backscattering geometry). The results are compared with reported data on natural diamond and on graphite. Polycrystalline chemical-vapor-deposited diamond exhibits a spectrum similar to that of natural, single-crystal diamond. Reference is also made to ionization loss spectroscopy in the transmission electron microscope and to near-edge, X-ray absorption fine structure measurements. The prominent features of the measured spectra are correlated with π and σ bonding. The applied method is sensitive to π bonding as well as being surface sensitive and, therefore, is particularly suited to check the deviation from perfect diamond bonding at the surface.
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