Abstract
The surface self-diffusion of tungsten was studied mainly by field ion microscopy (FIM). The atomic displacements observed have been evaluated in terms of diffusion coefficients. With more than one adatom on a plane at a time, interactions between adatoms occur, and binding energies may be deduced. Diffusion of single adatoms as well as of dimers and larger clusters was observed. In addition to FIM studies with atomic resolution, some effort was made to elucidate the dynamics of various tungsten surfaces also by field electron microscopy (FEM). In the following, a summary of reviews on FIM studies of tungsten selfdiffusion on various crystallographic surfaces is given. Then, measurements of correlations between fluctuations in the field-electron current (flicker noise) are described. The bulk of the following chapter involves the diffusion coefficient, D= Do • exp(— Q/kBT), which was determined on the various surfaces W(hkl) listed in order of increasing roughness.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
