Surface Science at the Nanoscale: Molecular Imaging and Surface Forces

Richard J. Colton,Eric I. Altman,Steven M. Hues

doi:10.1007/978-1-4757-9322-2_31

Surface Science at the Nanoscale: Molecular Imaging and Surface Forces

Richard J. Colton, Eric I. Altman + Show 1 more

https://doi.org/10.1007/978-1-4757-9322-2_31

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Publication Date: Jan 1, 1994

Citations: 2

Affiliation: United States Naval Research Laboratory, Yale University

#Scanning Tunneling Microscopy #Growth Of C60 Films + Show 8 more

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Abstract

This paper presents a general description of the use of the ne tip-based proximal probes—scanning tunneling microscopy (STM) and atomic force microscopy (AFM)—to study the nanoscale properties of surfaces. Using STM, we have examined the nucleation and growth of C60 films on Au(111) and Ag(111). In addition to imaging, we have measured the charge transfer between the metal and C60 using STM in the spectroscopic mode. AFM studies which focus on developing quantitative methods for measuring surface forces and the mechanical properties of surfaces are also presented.

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