Abstract
Departamento de Fi ´sica, Universidad Tecnica Federico Santa Mari´a, Casilla 110-V, Valparaiso, Chile~Received 16 April 1999; revised manuscript received 13 October 1999!We report measurements of the topography of a gold film deposited on a mica substrate using scanningtunneling microscope ~STM!, and measurements of the conductivity sof the film performed between 4 and300 K. From images obtained with the STM running in air in the constant current mode of a gold sample70-nm-thick deposited under UHV on a mica substrate preheated to 300 °C, we compute the average autocor-relation function ~ACF! that characterizes the surface of the film in the scale of 10310 nm
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