Abstract
The surface resistance R s of YBa 2Cu 3O 7 thin films has been measured as functions of temperature and magnetic field through a resonant cavity technique. Temperature dependence of R s was found to follow a BCS-like variation at higher temperature and deviate from the theoretical prediction at lower temperature. As the field was increased, R s increased linearly at low fields and nonlinearly at higher fields, which can be well accounted for in terms of flux motion. The anisotropy of R s is observed for H//c and H//ab. The result can be understood in terms of the intrinsic flux pinning and the relative orientation between rf current and dc field.
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