Abstract
Parallel-plate resonators have been used to measure the surface resistance R s of YBCO( YBa2Cu3O7-δ) thin films and bulk plates at X-band microwave frequency. A new simple coupling configuration which comprises a parallel-plate resonator inserted into a waveguide was adopted for the measurement. The surface resistance measurement on Au thin film showed good agreement with the calculated value. We measured the surface resistance on the YBCO parallel-plate resonators using both thin films and bulk plates in the temperature range from 50 K to 300 K. In the case of the YBCO thin films deposited on LaAlO3 substrate, we obtained R s values of 0.013 and 0.24 Ω at 77 and 300 K, respectively.
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