Abstract
For the traditional single-side planetary abrasive lapping process particle trajectories passing over the target surface are found to be periodically superposed due to the rational rotation speed ratio of the lapping plate to workpiece that could affect the material removal uniformity and hence its surface quality. This paper reports on a novel driving system design with combination of the tapered roller and contact roller to realize the irrational rotation speed ratio of the lapping plate to workpiece in the single-side planetary abrasive lapping process for the improvement of surface quality. Both of the numerical and experimental investigations have been conducted to evaluate the abrasive lapping performance of the novel driving system. It has been found from the numerical simulation that particle trajectories would theoretically cover the whole target surface if the lapping time is long enough due to their non-periodic characteristics, which can guarantee the uniformity of material removal from the surface of workpiece with relatively high surface quality. The encouraging experimental results underline the potential of the novel driving system design in the application of the single-side planetary abrasive lapping for the improvement of the surface quality in terms of surface roughness and material removal uniformity.
Highlights
Yuan et al [15] investigated the kinematics and trajectory of abrasive particles involved in the both-sides planetary abrasive lapping process and proposed the optimized strategy for the improvement of the material removal uniformity on the surface of the bearing roller. They only considered the rational rotation speed ratio of the lapping plate to workpiece and explored related kinematics to evaluate and optimize the distribution of the particle trajectories by properly controlling the processing parameters, while Wen et al [16] first proposed the concept of the irrational rotation speed ratio when they employed the single-side planetary abrasive lapping technology to fabricate interdigitated micro-channels on bipolar plates and found that after a long lapping time the particle trajectories were not superposed periodically
Conclusions this paper, a new concept of a driving system with combination of the InInthis paper, a new concept of a driving system designdesign with combination of the tapered tapered androller contact roller to the irrational rotation speed ratio of theplate lapping roller androller contact to realize therealize irrational rotation speed ratio of the lapping to plate to workpiece, ipw, in the planetary single-side planetary abrasive lapping process for the imworkpiece, ipw, in the single-side abrasive lapping process for the improvement of provement of is surface quality is presented
The uniformity assessment of particle trajectories moving the target surface driven by this novel system has been qualitatively and quantitatively the target surface driven by this novel system has been qualitatively and quantitatively investigated.ItItisisfound foundfrom fromqualitative qualitativeanalysis analysisthat thatwithin withinthe thesame samelapping lappingtime timethe the investigated
Summary
Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations. Yuan et al [15] investigated the kinematics and trajectory of abrasive particles involved in the both-sides planetary abrasive lapping process and proposed the optimized strategy for the improvement of the material removal uniformity on the surface of the bearing roller In these studies, they only considered the rational rotation speed ratio of the lapping plate to workpiece and explored related kinematics to evaluate and optimize the distribution of the particle trajectories by properly controlling the processing parameters, while Wen et al [16] first proposed the concept of the irrational rotation speed ratio when they employed the single-side planetary abrasive lapping technology to fabricate interdigitated micro-channels on bipolar plates and found that after a long lapping time the particle trajectories were not superposed periodically. A set of the single-side planetary abrasive lapping tests on single-crystal silicon wafers by employing the novel driving system and the traditional driving system, respectively, are carried out to experimentally evaluate its lapping performance
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