Abstract
The nature of surface hydroxyls present in the native air‐formed oxide film on titanium has been studied by X‐ray photoelectron spectroscopy (XPS), variable angle XPS, and secondary ion mass spectroscopy (SIMS). The surface isoelectric point of the oxide film on titanium is 5.0, as determined from XPS measurements; and the concentration of surface hydroxyl groups on oxide‐covered titanium is , as determined by quantitative XPS. © 1999 The Electrochemical Society. All rights reserved.
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