Surface plasmon resonance (SPR) reflectance imaging: Far-field recognition of near-field phenomena

Abstract

The surface plasmon resonance (SPR) reflectance imaging technique provides a label-free visualization tool to characterize the near-field fluidic transport properties within 100 nm from the solid surface. The key idea is that the SPR reflectance intensity varies with the near-field refractive index (RI) of the test fluid, which in turn depends on the micro- and nano-fluidic scalar properties such as concentrations, temperatures, and phase changes, occurring in the near-field. As essential knowledge to understand and implement the SPR reflectance imaging technique, this paper presents discussions on the basics of surface plasmon polaritons (SPPs), surface plasmon resonance (SPR), setup of the SPR reflectance imaging system, and the SPR reflectance imaging resolution. The second part of the paper elaborates the applications of the SPR imaging sensor technique in characterizing the near-field fingerprints of nanofluidic evaporative self-assembly.