Abstract
The possibility to detect and prospectively to characterize deposited organic layers directly on Spreeta sensors by Fourier transform Raman spectroscopy was studied. A special holder of sensors that enabled measurement of FT Raman spectra was developed. The effects of various angles of incidence of the laser beam on the sensor surface were studied with respect to the intensity of Raman spectra and to the risks of artifacts. No effect of measurement of FT Raman spectra on SPR functionality of sensors was proven. The key role of the surface morphology of the sensing gold layer on repeatability of SPR curves and the possibility to check the surface by optical microscopy was demonstrated.
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