Abstract
We present high-sensitivity fluorescent cell imaging results obtained by excitation of the deep-ultraviolet surface plasmon resonance (DUV-SPR). In this study, the excitation conditions for DUV-SPR in the Kretschmann configuration were optimized for cell imaging. The aluminum thickness was analyzed taking into consideration the refractive index of the cells on the aluminum surface. It was found that the optimum aluminum thickness was 21 nm, independent of the refractive index. We demonstrated that the fluorescence from stained cells on the aluminum thin film was enhanced by DUV-SPR. The fluorescence intensity obtained by DUV-SPR excitation was three times higher than that obtained by conventional fluorescence microscopy.
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