Abstract

Thin films of lead have been grown on the Cu(111) surface and their structure and phonon dispersion curves have been investigated with high-resolution helium atom scattering. The diffraction pattern of the first monolayer (ML) indicates a $p(4\ifmmode\times\else\texttimes\fi{}4)$ structure. Films consisting of $N=3$, 4, 5, and bulklike 50 ML all have a regular $(1\ifmmode\times\else\texttimes\fi{}1)$ structure with the same lattice constant as the bulk and small superimposed $p(4\ifmmode\times\else\texttimes\fi{}4)$ peaks for the thinnest films. The time-of-flight spectra reveal an unusually large number of inelastic peaks for all the films. The results have been analyzed in terms of dispersion curves which exhibit more than $\frac{1}{2}$ the total number of expected two $N$ modes active in the planar scattering geometry. Dispersion curves for an unannealed 5 ML film are also reported. A force-constant model fitted to the bulk dispersion curves can only qualitatively reproduce some of the data but help to explain some features. Along the $\overline{\ensuremath{\Gamma}}\ensuremath{-}\overline{K}$ direction, a Kohn anomaly is identified for the 3, 4, and 5 ML films at nearly the same wave vector as in the bulk along the equivalent direction.

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