Abstract
Structural and optical properties of CdTe thin films were investigated applying atomic force microscopy (AFM), XRD powder technique, Raman spectroscopy and far–infrared spectroscopy. CdTe thin films were prepared by using thermal evaporation technique. In the analysis of the far – infrared reflection spectra, numerical model for calculating the reflectivity coefficient for system which includes films and substrate has been applied. Effective permittivity of film mixture (CdTe and air) was modeled by Maxwell – Garnet approximation. We reveal the existence of surface optical phonon (SOP) mode and coupled plasmon-SOP modes (CPSOPM).
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