Abstract
Thin films of the quasi one-dimensional organic conductor TTF-TCNQ grown on KCl (001) substrates by Chemical Vapor Deposition has been analyzed with Atomic Force Microscopy. The films are polycrystalline, composed of microcrystals with rectangular shape with the c∗ crystallographic axis perpendicular to the substrate. The stepped surface morphology of the microcrystals has been studied. The growth of the films is strongly dominated by an oriented nucleation and the one-dimensional nature of the compound.
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