Abstract
The thin films of CoFe2O4 spinel ferrite were prepared on the substrates of monocrystalline silicon(100) at low temperature by means of a developed citrate processing.Structural properties and surface morphology of deposited films were examined using an X-ray diffractometer (XRD) and a field emission scanning electron microscope (FESEM). XRD patterns of all deposited films consisted of a single phase of cobalt ferrite and they did not have any preferred orientation. FESEM micrographs of CoFe2O4 films showed that the film calcined at 400°C had a surface morphology different from the ones at 700°C and 800°C. The surface morphology of the samples was very different with various alcined temperatures. Magnetic properties measured at room temperature showed that the films did not have any magnetically preferred orientation. The maximum values of the coercivities measured at perpendicular and in-plane directions were 3.873 and 2.70 kOe, respectively.
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