Abstract
The surface morphology and crystal quality of epitaxial La2-xSrxCuO4 (x≈0.15) thin films grown in situ by rf-magnetron sputtering on SrTiO3(100) substrates are examined by high resolution scanning electron microscopy (HRSEM) and reflection high-energy electron diffraction (RHEED). The surface of films grown at substrate temperatures higher than 550°C, is characterized by atomically flat grains indicative of two-dimensional growth. There are precipitates between the grains due to the off-stoichiometric film composition, which appear to prevent lateral atomic migration, and cause ditches. Despite these precipitates and ditches, these grains have high crystalline quality which is revealed by a streaky ring-shaped RHEED pattern indicating a crystal coherency extending for a few hundred µm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
