Abstract
Influences of low energy D+ ion bombardment and target temperature on surface topography, surface concentration and erosion yield of carbon based binary compounds were investigated. The samples contained 10 at.% Si and 10 at.% Ti, respectively. The surface concentration was determined in situ by Auger electron spectroscopy and the topography ex situ by scanning electron microscopy. During low energy D+ bombardment a pronounced conelike surface developed with silicon respective titanium rich ‘caps’ protecting the underlaying carbon rich shafts from erosion. The average dopant surface concentration was up to 7 × the bulk concentration. The erosion mechanism was determined by surface concentration and chemical state of the surface: At high temperatures carbidic bindings dominated, while at room temperature a mixture of graphite and carbide covered the surface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
