Abstract

In this paper we present STM images of thin epitaxial Nb-films taken in situ during H2 gas-exposure. We find that the in-plane stresses relax by forming misfit dislocations near the substrate–film interface visible as glide steps at the film surface. The orientation of different glide steps at the surface shows that (011) and (12̄1) glide planes are involved. Also, we show that the arrangement of the hydride is irregular in lateral direction and grows vertically through the complete film.

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