Abstract
In the present work, the effects of swift silver ion irradiation in crystalline gallium phosphide samples with various fluences ranging between 1×1011 and 2×1013ionscm−2 have been described. Atomic force microscopy images of the samples irradiated with different fluences showed the existence of hillocks at the surface, the diameter and density of these clusters were found to be depend on the ion fluence. As the ion fluence increased (⩾1×1013ionscm−2), the big size hillocks having arbitrary shapes were observed due to outflow of the molten material to the sample surface or defect induced swelling of track areas accumulated during the track overlapping. Phonon confinement model employed to first order Raman scattering from longitudinal optical phonon mode revealed the decrease in phonon coherence length from 73.0nm to 23.7nm with the increase in ion fluence from 1×1012 to 2×1013ioncm−2.
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