Abstract

The paper investigates the microstructure and property modifications of Al–12.6Si alloy induced by high current pulsed electron beam (HCPEB) treatment. The scanning electron microscope (SEM) results show a fine and equiaxed grain structure of several micrometers is obtained on the top surface of the melted layer. Underneath the top surface, a remelted layer with about 10μm thickness is obtained and a supersaturated solid solution of Al is formed in the remelted layer. XRD analysis shows that the relative strength of diffraction peaks of Al (111) and Si (111) crystal planes is increased after HCPEB treatment. As a result, relative wear resistance of HCPEB-treated sample is significantly improved by a factor of 2.5 due to fine grain strengthening and solid solution strengthening. Therefore, the HCPEB treatment has a good application future in treating Al–Si alloys.

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