Abstract

The effects of the wet-chemical and plasma treatments on the adhesion of electroless and sputter-deposited copper to the photodefinable epoxy have been investigated. The wet-chemical treatment increased the amounts of oxygen-containing functionalities on the epoxy surface mainly during the early stage of etching. With the longer etching the pronounced surface roughness was revealed in the form of microcavities. The plasma treatment increased significantly the polar component of surface free energy of the epoxy and produced low surface roughness. The physicochemical changes of the epoxy combined with the experimental adhesion results indicated that in the case of the electroless deposition the mechanical interlocking was the main adhesion mechanism. Sputter-deposited copper exhibited the highest pull strengths on the epoxy when the plasma pretreatment with oxygen was employed. The enhancement of the surface polarity of the epoxy and the enlarged surface contact area due to the increased roughness were the most important factors in the adhesion.

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