Abstract

Abstract The surface loss probability γ O of atomic oxygen was measured for SiO2 in atmospheric-pressure CO2 and Ar/CO2(3.05%) mixture at 300 K. O atoms were produced via the photolysis of CO2 using a 172 nm Xe2 excimer lamp. After irradiation by Xe2 lamp, the working gas flowed through a quartz tube, causing O atoms to be lost on its inner surface. By measuring the density of O atoms at the end of the tube for different tube lengths, we obtained the value of γ O on the inner surface of the tube. The measured value was 5.5 × 10 − 4 ± 50 % , which falls within the range of referred values of γ O ( 1 × 10 − 5 to 1 × 10 − 3 ) at 4 to 1300 Pa measured using low-pressure O2 plasmas. Despite the 2 to 5 orders of magnitude pressure difference, no significant difference in γ O was obtained. The potential influence of the difference in background gas (CO2 and O2) on the value of γ O was also considered.

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