Abstract
The contribution of low-energy particles down to ~200 eV to the dose deposited on the very near surface of materials subject to the space environment is investigated by means of GEANT4 Monte Carlo simulations. The contribution to the dose, of the low-energy parts of Global Radiation Earth ENvironment (GREEN) spectra (200 eV-40 keV for electrons, 200 eV-100 keV for protons), is compared with calculations performed with AE8/AP8. Both geostationary earth orbit (GEO) and low earth orbit (LEO) SPOT like orbits are studied. The dose depth profiles are estimated for silicon material. The impact on the dose calculation of different transport models is also investigated. Below 1 keV, the relevance of continuous processes is analyzed for electrons by comparison with a discrete model [GEANT4/microelectronic (MICROELEC)]. This analysis is also performed for protons below 10 keV.
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