Abstract
We report the first results of surface collisions of pure hollow fullerenes (C60, C70 and C78) and endohedral metallofullerenes (Y@C82, Ca@C82 and Ca@C84), isolated by liquid chromatography, against solid (silicon and gold) surfaces and self-assembled monolayer (SAM) films. The experiments have been performed by a reflectron type time-of-flight mass spectrometer modified for measuring surface-induced dissociation (SID) spectra. No surface-induced fragment is observed for the surface collisions with the solid surfaces and the alkanethiolate SAM film. In contrast, sequential C2-loss fragments have been observed for the surface collisions of hollow fullerenes and Ca@C84 with the fluorinated SAM film.
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