Abstract
Using a ring microstrip resonator technique, the surface impedance of V3Si sputtered films has been measured as a function of temperature and dc and rf field amplitude. The results are analyzed in terms of the Bardeen–Cooper–Schrieffer theory and of a grain-boundary Josephson model, and discussed in the framework of the possible application of V3Si as a thin-film coating of superconducting rf cavities for particle accelerators.
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