Abstract
We report microstructure analyses and superconducting radiofrequency (SRF) measurements of macroscopic scale epitaxial MgB2 films. MgB2 films on 5 cm diameter sapphire disks were fabricated by a hybrid physical chemical vapor deposition (HPCVD) technique. The electron-beam backscattering diffraction (EBSD) results suggest that the film is a single crystal complying with a MgB2(0001)∥ Al2O3(0001) epitaxial relationship. The SRF properties of different film thicknesses (200 and 350 nm) were evaluated under different temperatures and applied fields at 7.4 GHz. A surface resistance of 9 ± 2 μΩ has been observed at 2.2 K.
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