Abstract
Ferrocene-containing molecules have been grafted to Si(100) surfaces to form monolayers and multilayers via a triazene derivative and its subsequent diazonium chemistry. The growth of the ferrocene-containing films was controlled by molecular concentrations and reaction times. Results from ellipsometry showed that the film thicknesses were in the range of subnanometer to several nanometers. X-ray photoelectron spectroscopy has confirmed the structural integrity of ferrocene in the films. Electrochemical studies of the ferrocene-containing multilayer have shown a reversible one-electron wave of the ferrocene/ferrocenium couple. The multilayer coverage was found to be 2.8 × 10−9 mol cm−2. The calculated electron transfer rate constant was 164 s−1.
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