Abstract
A new type of resonance in the development of sensors using long-range surface exciton polariton (LRSEP) phenomena has been coined: surface exciton polariton resonance (SEPR). The resonance was obtained in the reflected spectrum of a Kretschmann-Raether setup with a two-coupled-interface structure composed of 412 nm magnesium fluoride and 50 nm chromium thin films. The roles of different parameters such as thicknesses of the films and the incidence angles have been simulated. Some preliminary experimental results show a promising performance with a shift of the resonance central wavelength with changes in the incidence angle of -136.52 nm/° and a sensitivity of 23,221 nm/refractive index unit.
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