Abstract
Extended X-ray absorption fine structure (EXAFS) studies are a powerful technique for studying the chemical environment of specific atoms in a molecular or solid matrix. The study of the surface layers of “thick” materials introduces special problems due to the different escape depths of the various primary and secondary emission products which follow X-ray absorption. The processes are governed by the properties of the emitted fluorescent photons or electrons and of the material. Their interactions can easily destroy the linear relation between the detected signal and the absorption cross-section. Also affected are the probe depth within the surface and the background superimposed on the detected emission signal. A general mathematical model of the escape processes is developed which permits the optimisation of the detection modality (X-rays or electrons) and the experimental variables to suit the composition of any given surface under study.
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