Abstract
Surface enhanced Raman scattering (SERS) of organic molecules on evaporated silver films of 20–30 nm in mass thickness has been investigated using the Kretschmann ATR configuration. The metal films were continuous but had numerous defects such as pores and crevices. The SERS on these surfaces was short-ranged even in the case where the chemical contribution is ruled out. We found that there is an intimate correlation between the SERS intensity and the electric field strength within the metal layer calculated with the Fresnel formula. These results can be well explained by assuming that the molecules within the pores and crevices exhibit such enhancement.
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