Abstract
The surface diffusion kinetics has been measured on an Au60Cu15.5Ag7.5Si17 metallic glass using the method of surface grating decay from room temperature up to 20 K below the glass transition temperature (Tg). In the early stage of grating decay, the surface diffusion coefficients were estimated as varying in the range of 10−20 to 10−18 m2/s and the corresponding average activation energy is about 0.67 eV. During longer annealing, times the surface grating decay rate slowed down significantly. The slowing of the initial decay was a result of the surface dynamics and influenced by the surface segregation of silicon at a long time, which induced a surface crystallization of a silicon-rich phase.
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