Abstract
Self-assembled molecular thin films of melamine-bridged bis-porphyrin dyad, both in free form, P(H2)P(H2), or as Zn(II) metallated complex, P(Zn)P(Zn), were deposited on crystalline Si(100) by soaking or drop-casting techniques. The influence of the adopted preparation methodology, the substrate surface pre-activation procedure and the used solvent (THF or CHCl3) on the morphology and surface coverage of the resulting films was investigated by FE-SEM (Field Emission-Scanning Electron Microscopy) and AFM (Atomic Force Microscopy). The chemical composition and electronic structure of the most promising systems were also addressed by XPS (X-ray Photoelectron Spectroscopy). The results pointed out that an accurate tuning of porphyrin-porphyrin, porphyrin-substrate and porphyrin-solvent molecular interactions allow to tailor the morphogenesis and chemico-physical properties of the final self-assembled films. In addition, preliminary gas sensing tests evidenced the potential of the present porphyrin-based films for the development of new molecular sensing devices.
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