Abstract
For the interpretation of flicker noise in field emission occurring by surface diffusion of adsorbed molecules an adsorption model is analyzed for a homogeneous surface. Beside the weaker binding adsorption sites of the undisturbed surface a second stronger binding sort of sites is assumed taking thus into account the well-known structure irregularities of annealed emitters. The admolecule transition rate K between these sites derived from statistical and kinetic arguments determines essentially the noise by modulation of the microscopic work function; therefore, the K-dependence on temperature and on the degree of coverage is presented and discussed. The spectral density function is determined by use of the Bess formalism originally developed for a semiconductor current noise. The frequency and current dependences of the resulting flicker noise are analyzed. The model is extended to the case of surface diffusion noise at desorption-adsorption equilibrium.
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