Abstract
Thin films of Bi/sub 2/Sr/sub 2/CuO/sub 6+x/ (2201) phase have been tilted SrTiO/sub 3/ [001] substrates by co-deposition method, and Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+x/ (2212) phase by interruption technique. The surface diffusion characteristics the molecular beam epitaxy (MBE) of both phases have also been investigated by using in-situ reflection high energy electron diffraction (RHEED). The periodic RHEED intensity oscillations and recovery process been analyzed for 2201 and 2212 phases. >
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
