Abstract
The impact of surface depletion on the electronic properties of semiconductor nanowires (NWs) is explored both theoretically and experimentally. The impact of dopant concentration, surface barrier height, and NW radius on surface depletion and extracted material properties are determined by solving Poisson’s equation for the cylindrical system. The theoretical results reveal a size-dependent systematic error in carrier concentration extraction, which is verified through experiment. Interrogation of GaN NWs with radii from 15 to 70 nm exposed an error that reaches over an order of magnitude for the samples studied. These data compared favorably to an analytical treatment assuming physically reasonable material properties. While this manuscript focuses on GaN, the systematic error discussed will be present for any semiconducting NW, which exhibits surface band bending and therefore influences the behavior and characterization of a wide range of semiconducting nanoelements.
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