Abstract
AbstractQuantitative analysis of the surface relaxation of thick Yb(111) films grown on W(110) has been performed by photoelectron diffraction (PED) using high‐energy resolution Yb 4f surface core‐level‐shift photoemission spectra. Scanned PED spectra were measured by recording the intensity variation of the bulk and the surface components of the 4f7/2 and 4f5/2 emissions over a photon energy range 140–260 eV for different experimental geometries. Additionally, angular scans for a fixed photon energy of 150 eV were recorded in the crystal high symmetry directions. Analysis of the data set following a trial‐ and ‐error procedure confirmed that Yb grows epitaxially in an fcc structure, without surface reconstruction. The obtained bulk lattice parameter corresponds to 5.44 Å, which is ∼1% contracted with respect to the natural crystal. From the PED surface components an inward relaxation by 3.6 ± 0.3% of the outermost surface layer of Yb is obtained. Copyright © 2002 John Wiley & Sons, Ltd.
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