Surface and displacement damage engineering on CdSe nanocrystalline thin film by swift heavy Ag ions: A theoretical investigation by SRIM/TRIM package

Abstract

Engineering of surface and structural properties of a sample by ion beam technology has got tremendous attention in recent times. Here, surface modification in CdSe nanocrystalline thin film due to 120 MeV Ag swift heavy ions (SHI) irradiation has been studied through Stopping and Range of Ions in Matter (SRIM)/Transport of ions in matter (TRIM) package in terms of sputtering yield and average surface binding energy. From this study, average range has been obtained as 1.6 μm and average surface binding energy as 1.7 eV. SHI deposits huge energy to the atomic lattice and that displaces the lattice atoms from their original positions, which has been utilized here to obtain displacement damage. The damage profile has been studied as a function of dpa, which shows that the maximum displacement damage peaks is at 1.5 μm for CdSe due to 120 Mev Ag ions irradiation.