Abstract
If the density difference, or intensity difference, of two spectrum lines used in analysis is plotted against the concentration of the impurity, a calibration line is obtained. Calibration lines for the same impurity in alloys in which the base metal concentration is varied are shifted laterally. Each spectrum line intensity is proportional to the mth power of the atomic concentration of the element emitting it in the source, and m can be calculated from the calibration line shift, with an accuracy limited by the stability of the source and uniformity of the photographic process.
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