Abstract
The main joining process of the electronic industry is still soldering with different alloys of Sn. This work studied the relationship between Sn whisker growth and corrosion resistance of 99Sn0.3Ag0.7Cu–TiO2/ZnO (0.25wt%) composite solder alloys in a corrosive environment via scanning electron microscopy and focused ion beam techniques. The corrosive environment test showed that the application of TiO2 and ZnO nano-particles almost totally suppressed the Sn whisker growth and improved the corrosion resistance of the composite solder alloys compared to the reference 99Sn0.3Ag0.7Cu alloy. The microstructural analysis of the reference 99Sn0.3Ag0.7Cu solder alloy showed that the volumetric increase of the corroded β-Sn grains resulted in local mechanical stress in the solder joints, which was released by Sn whisker development. However, in the composite solder joints, the increased grain boundary fraction and segregation of the TiO2 and ZnO nano-particles to the grain boundaries resulted in a relatively uniform and compact protective oxide layer at the β-Sn grain boundaries. This suppressed the formation of SnOx, and via this, the corrosion-induced whisker growth.
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