Abstract
Spin-dependent transport properties of micro- and nano-scale electronic devices are commonly studied by electrically detected magnetic resonance (EDMR). However, the applied microwave fields in EDMR experiments can induce large rectification effects and result in perturbations of the device bias conditions and excessive noise in the EDMR spectra. Here we examine rectification effects of silicon metal-oxide-semiconductor field-effect transistors exposed to X-band microwave irradiation and show that the rectification effects can be effectively suppressed by incorporating a global capacitive shunt covering the device. We demonstrate that the signal-to-noise ratio in the EDMR spectra improves by over a factor of ten in the shunted devices.
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