Abstract
A passive method based on an optimized quasiachromatic condition effectively suppresses emittance variation during the independent tuning of insertion devices (IDs), which is one of the major obstacles for conducting precise experiments in extremely low emittance light source storage rings. This method, simple and easy to apply to any light source storage ring, reduces the emittance variation to potentially less than 1% by carefully optimizing dispersion leakage at the straight sections where the IDs are installed according to an actual condition of the ID independent tuning.
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