Abstract
We propose an interferometer in which the relationship between the degree of coherence (DCH) and the optical path difference (OPD) is utilized for determining an OPD longer than a wavelength. A superluminescent diode is employed as the source of the interferometer, and sinusoidal phase-modulating interferometry is used to detect the DCH and the phase of the interference signal. The combination of the OPD determined from the DCH and the phase of an interference signal enables us to measure an OPD longer than a wavelength with a high accuracy of a few nanometers. Experimental results show clearly the usefulness of the interferometer for a step-profile measurement.
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