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Abstract
Thin superconducting films of type Chromium incorporated YBa2Cu3CrxO6+δ have been grown by Pulsed Laser Deposition (PLD). The prepared films have been characterized using X-ray powder diffraction (XRD) and Energy Dispersive X-Ray (EDS) analysis. The superconducting transition temperature Tc determined from electrical resistivity measurements was found to slightly increase for low Cr-content (x) and decreases when x > 0.05. Furthermore, the surface morphology of the Cr doped and the pure YBCO films were investigated by Scanning Probe Microscope (SPM).
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