Abstract
Improved measurements were made of the temperature-dependent resistivity of amorphous Bi films in order to observe the effects of superconducting fluctuations. Measurements were made in the temperature range ${T}_{c}\ensuremath{\le}T\ensuremath{\le}2.5{T}_{c}$ on films ranging from 500 to 5000 \AA{} thick. Temperature resolution near ${T}_{c}$ of 0.2 mK and precise resistance measurements at higher temperatures (1 part in ${10}^{4}$) permitted a detailed comparison with theory. Films over 500 \AA{} thick showed a temperature-dependent transition from thin-film (two-dimensional) behavior to bulk (three-dimensional) behavior in agreement with the predictions af Aslamzov and Larkin.
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