Abstract
Ordered nanostructured cobalt-doped nickel oxide films were prepared on a conducting glass substrate via the sol–gel dip-coating method. X-ray diffraction analysis shows the films to be amorphous. Field-emission scanning electron microscope images showed well-defined, ordered grains with pores in between them. Supercapacitor behaviour was studied using cyclic voltammetry. A maximum specific capacitance of 1982 F/g at a scan rate of 5 mV/s with 1 M KOH was obtained for 5 wt% of cobalt-doped nickel oxide films. AC impedance analysis showed that the solution resistance was R s = 27 Ω and the charge transfer resistance R ct = 20 Ω.
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