Super-resolution Scanning Electrochemical Microscopy

Abstract

To achieve super-resolution scanning electrochemical microscopy (SECM), we must overcome the theoretical limitation associated with non-contact electrochemical imaging of surface-generated species. This is the requirement for mass transfer to the electrode, which gives rise to the diffusional broadening of surface features. In this work, a procedure is developed for overcoming this limitation and thus generating ``super-resolved" images using point spread function (PSF)-based deconvolution, where the point conductor plays the same role as the point emitter in optical imaging. In contrast to previous efforts in SECM towards this goal, our method uses a finite element model to generate a pair of corresponding blurred and sharp images for PSF estimation, avoiding the need to perform parameter optimization for effective deconvolution. It can therefore be used for retroactive data treatment and enhanced understanding of the structure-property relationships that SECM provides.