Super-resolution optical imaging: A comparison

Abstract

Abstract Overcoming the classical diffraction limit in optical microscopy is known to be achievable by a variety of far-field and near-field microscopy techniques. More recently, so-called micro-object-based optical super-resolution microscopy techniques have emerged. In this review, we provide an overview of the state-of-the-art of optical super-resolution imaging techniques. In the first section, far-field techniques are discussed, which can be considered as advanced classical optical microscopy methods that mostly operate with fluorescent samples. In the second section, near-field techniques are presented that achieve super-resolution by maintaining a close distance between a nanometric detection unit and the sample, such that evanescent waves can be captured and processed. Near-field methods typically involve some scanning procedure to be able to map a reasonably large area of the sample. In the third section, dielectric micro-object-based techniques are discussed. These provide a more recent, practical and affordable alternative to the other super-resolution microscopies. Finally, we provide a comparison of the presented techniques in terms of performance and cost, pointing out the application-specific strength of each imaging method.