Abstract
We propose a new wide-field imaging method that exploits the Localized Surface Plasmon Resonance phenomenon to produce super-resolution images with an optical microscope equipped with a custom design polarization analyzer module. In this paper we describe the method and apply it to the analysis of low-energy carbon ion tracks implanted in a nuclear emulsion film. The result is then compared with the measurements of the same tracks carried out at an electronic microscope. The images set side by side show their close similarity. The resolution achieved with the current microscope setup is estimated to be about 50 nm.
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