Abstract

In this paper, we propose a new super-resolution imaging technique based on fluorescence blinking (SRFB). Contrary to structured illumination microscopy (SIM), SRFB considers the time-varying fluorescence distribution under a suitable density as the varying illuminated speckle pattern, and therefore, external speckle patterns or diffusers are not required. With several images recorded at different times, a super-resolution image can be obtained through an iterative algorithm modified from Fourier ptychography. Recorded image sequences in a microscopy imaging experiment based on photo switching or fluorescence blinking effects, such as STORM and SOFI, can be handled with SRFB and used to recover a super-resolution image. The simulation and experimental results confirm that the SRFB scheme can surpass the diffraction limit by a factor greater than two.

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