Summary

Abstract

In this book, we have discussed the emergent 2D materials, which are going to be the frontiers in each and every aspect of the nanotechnology and optoelectronics world. However, the fruitful application of these 2D nanomaterials and the intrinsic and extrinsic properties have to be investigated thoroughly. Therefore, characterization techniques like optical based techniques, time resolved terahertz spectroscopy, Raman spectroscopy, x-ray based techniques, probe-based techniques, electron diffraction-based techniques, analytical techniques, etc., along with their theoretical attributes come in handy for exploring more and more about the novel 2D material. This book will also help to develop a protocol for the characterization of novel 2D materials for technological application. We have elaborated on all these characterization techniques with proper scientific discussions so as to establish a correlation with the properties and performance of newly discovered/synthesized 2D materials. All the primary principles involving these techniques, their instrumentation and the recent trends involving the characterization of 2D materials with the proposed techniques have been meticulously exemplified. However, there are some challenges that cannot be disregarded and must be looked into. The major critical challenges and future viewpoints of each of the techniques have been particularized in their respective chapters, yet a few overall comments have been included below.